Specific Process Knowledge/Lithography/UVLithography: Difference between revisions
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|<30 mJ/cm2 per µm resist for i-line, decreasing with increasing thickness. | |<30 mJ/cm2 per µm resist for i-line, decreasing with increasing thickness. | ||
Same dose for broadband exposure. | Same dose (@365nm) for broadband exposure. | ||
|AZ 726 MIF developer | |AZ 726 MIF developer | ||
|DI water | |DI water | ||