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Specific Process Knowledge/Lithography

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Comparing lithography methods at Danchip

UV Lithography DUV Stepper Lithography E-beam Lithography Nano Imprint Lithography 2-Photon Polymerization Lithography
Generel description Generel description - method 1 Generel description - method 2 Electron beam lithography 4 5
Pattern size range
  • ~1µm and up
  • ~200nm and up
  • ~12nm - 1 µm
  • ~20nm and up
  • 3D: 0.3 µm spot; 1.3 µm high
Resist type
  • UV sensitive:
    • AZ
    • SU-8
  • DUV sensitive
    • KSF M230Y
    • KSF M35G
  • E-beam sensitive
    • ZEP502A (positive)
    • HSQ (negative)
    • SU-8
  • Imprint polymers:
    • ??
  • UV cross-linking:
    • IP photoresists
    • SU-8
Resist thickness range
  • ~0.5µm to 20µm?
  • ~50nm to 2µm?
  • ~30nm to 0.5 µm
  • ~20nm to 10µm?
  • ?nm - ?µm
Typical exposure time

2s-30s pr. wafer

?-? pr. ?

Depends on dose, Q [µC/cm2], beam current, I [A], and pattern area, A [cm2]: t = Q*A/I

? pr. wafer

? pr. µm2

Substrate size
  • small samples
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
  • 100 mm wafers
  • 150 mm wafers
  • 200 mm wafers

We have cassettes that fit to

  • 4 small samples (20mm, 12mm, 8mm, 4mm)
  • 6 wafers of 50 mm in size
  • 2 wafers of 100 mm in size
  • 1 wafer of 150 mm in size

Only one cassette can be loaded at time

  • small samples
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
  • Cover slides
  • 50 mm wafers
  • 100 mm wafers
  • IBIDI
Allowed materials
  • Allowed material 1
  • Allowed material 2
  • Allowed material 1
  • Allowed material 2
  • Allowed material 3
  • Si, SiO2, III-V materials
  • Allowed material 1
  • Allowed material 2
  • Allowed material 3
  • Allowed material 1
  • Allowed material 2
  • Allowed material 3


Equipment Pages

UV Lithography

Pretreatment

Coaters

UV Exposure

Baking

Development

Strip

Lift-off

Wafer Cleaning

DUV Stepper Lithography

E-Beam Lithography

NanoImprint Lithography

3D Lithography