Jump to content

LabAdviser/Process Flow/Solar cell process flow: Difference between revisions

Mmat (talk | contribs)
mNo edit summary
Mmat (talk | contribs)
mNo edit summary
Line 478: Line 478:
|4 point probe inspection
|4 point probe inspection
|Measure the metal sheet resistance on the wafer backside with a 4 point probe.
|Measure the metal sheet resistance on the wafer backside with a 4 point probe.
|[[Specific_Process_Knowledge/Characterization/4-Point_Probe|4 point probe]]  
|[[Specific Process Knowledge/Characterization/Four-Point Probe|4 point probe]]  
| 
| 
|-
|-