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Specific Process Knowledge: Difference between revisions

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!Materials
!Materials
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|-
|rowspan="5" valign="top"|[[Specific Process Knowledge/Doping|Doping]]
|rowspan="5" valign="top"| [[Specific Process Knowledge/Doping|Doping]]
|Ion implant
|Ion implant
|?
|?
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!Materials
!Materials
|-
|-
|[[Specific Process Knowledge/Thermal Process|Thermal Process]]
|rowspan="5" valign="top"|[[Specific Process Knowledge/Thermal Process|Thermal Process]]
|Annealing (>350C)
|Annealing (>350C)
|Si, PECVD layers, Al, BCB curing, Polymer
|Si, PECVD layers, Al, BCB curing, Polymer
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|-
|
|Oxidation
|Oxidation
|Si wafers
|Si wafers
|-
|-
|
|Doping with B/P
|Doping with B/P
|Si wafers
|Si wafers
|-
|-
|
|Pyrolysis
|Pyrolysis
|Resists: AZ, SU8, PDMS
|Resists: AZ, SU8, PDMS
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|-
|
|Rapid Thermal Anneal (RTP)
|Rapid Thermal Anneal (RTP)
|SiO2, Si3N4, Ti, III-V
|SiO2, Si3N4, Ti, III-V