Specific Process Knowledge: Difference between revisions
Appearance
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|ECV (Electrochemical Capacitance-Voltage) -profiler | |ECV (Electrochemical Capacitance-Voltage) -profiler | ||
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|Direct Bandgap | |Direct Bandgap | ||
|Photoluminescence | |Photoluminescence | ||
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|Lattice mismatch | |Lattice mismatch | ||
|X-ray diffractometer | |X-ray diffractometer | ||
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|Defects/contamination | |Defects/contamination | ||
|Particle/defect counter | |Particle/defect counter | ||