Specific Process Knowledge: Difference between revisions

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|Sample Imaging -XY dimentions
|Sample Imaging, XY dimensions
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|Microscopy: optical,SEM,AFM
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|Sample Topography
|Sample Topography
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|AFM,Profiling with stylus or optical
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|Film thickness and optical constants
|Film thickness and optical constants
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|Ellipsometry,Reflectometry,Prism Coupling
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|Film Stress  
|Film Stress  
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|Profiling with stylus or optical
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|Element analysis
|Element analysis
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|XPS,EDX,SIMS
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|Resistivity
|Resistivity
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|Four point probe
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Revision as of 11:20, 18 July 2014

2nd Level - Process Topic

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Choose the process topic you are interested in

The section below here is under construction

Overview of sample processing 3

Bond your samples together
Entry page in LabAdviser Techniques Materials
Characterize your sample
Entry page in LabAdviser Techniques Materials

Overview of sample processing 4


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