Specific Process Knowledge/Lithography/Strip: Difference between revisions
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[[Category: Equipment|Lithography strip]] | |||
[[Category: Lithography|Strip]] | |||
__TOC__ | |||
= Strip Comparison Table = | |||
{| class="wikitable" | |||
{| | |||
|- | |- | ||
| | ! | ||
| | ! [[Specific_Process_Knowledge/Lithography/Strip/plasmaAsher03|Plasma Asher 3: Descum]] | ||
! [[Specific_Process_Knowledge/Lithography/Strip/plasmaAsher04|Plasma Asher 4 (Clean)]] | |||
| | ! [[Specific_Process_Knowledge/Lithography/Strip/plasmaAsher05|Plasma Asher 5 (Dirty)]] | ||
! [[Specific_Process_Knowledge/Lithography/Strip/resistStrip|Resist strip]] | |||
! [[Specific Process Knowledge/Lithography/LiftOff|Lift-off]] | |||
|- | |- | ||
| | ! scope=row style="text-align: left;" | Purpose | ||
| | | Resist descum | ||
| | | | ||
| | *Resist stripping | ||
*Resist descum | |||
*Surface treatment | |||
*Other ashing of organic material | |||
| | |||
*Resist stripping | |||
*Resist descum | |||
*Surface treatment | |||
*Other ashing of organic material | |||
| Resist stripping | |||
| Metal lift-off | |||
|- | |- | ||
| | ! scope=row style="text-align: left;" | Method | ||
| | | Plasma ashing | ||
| | | Plasma ashing | ||
| | | Plasma ashing | ||
| Solvent & ultrasonication | |||
| Solvent & ultrasonication | |||
|- | |- | ||
| | ! scope=row style="text-align: left;" | Process gasses | ||
| | | O<sub>2</sub> (50 sccm) | ||
| | | | ||
| | *O<sub>2</sub> (0-500 sccm) | ||
*N<sub>2</sub> (0-500 sccm) | |||
| | |||
*O<sub>2</sub> (0-500 sccm) | |||
*N<sub>2</sub> (0-500 sccm) | |||
*CF<sub>4</sub> (0-200 sccm) | |||
| NA | |||
| NA | |||
|- | |- | ||
| | ! scope=row style="text-align: left;" | Process power | ||
| | | 10-100 W (10-100%) | ||
| | | 150-1000 W | ||
| | | 150-1000 W | ||
| NA | |||
| NA | |||
|- | |- | ||
| | ! scope=row style="text-align: left;" | Process pressure | ||
| | | 0.8 mbar | ||
| | | 0.5-1.5 mbar | ||
| | | 0.5-1.5 mbar | ||
| NA | |||
| NA | |||
|- | |- | ||
! scope=row style="text-align: left;" | Process solvent | |||
| NA | |||
| NA | |||
| NA | |||
= | |||
| | |||
| | |||
| | | | ||
*NMP (Remover 1165) | |||
*IPA (rinsing agent) | |||
| | | | ||
*NMP (Remover 1165) | |||
*IPA (rinsing agent) | |||
|- | |- | ||
| | ! scope=row style="text-align: left;" | Process temperature | ||
| | | Up to ~100°C | ||
| | | Up to ~100°C | ||
| Up to ~100°C | |||
| Up to ~65°C | |||
| Up to ~65°C | |||
|- | |- | ||
| | ! scope=row style="text-align: left;" | Process time | ||
|20 | | 1-10 minutes | ||
| | |||
|20 | *Stripping: 20-90 minutes | ||
*Descum: 5-15 minutes | |||
*Surface treatment: Seconds to minutes | |||
*Other ashing: Hours, material dependent | |||
| | |||
*Stripping: 20-90 minutes | |||
*Descum: 5-15 minutes | |||
*Surface treatment: Seconds to minutes | |||
*Other ashing: Hours, material dependent | |||
| | |||
*NMP (Remover 1165) | |||
*IPA (rinsing agent) | |||
| | |||
*NMP (Remover 1165) | |||
*IPA (rinsing agent) | |||
|- | |- | ||
! scope=row style="text-align: left;" | Substrate batch | |||
| | | | ||
*Chips: several | |||
*50 mm wafer: several | |||
*100 mm wafer: 1 | |||
| | |||
*Chips: several | |||
*50 mm wafer: several | |||
*100 mm wafer: 1-25 | |||
*150 mm wafer: 1-25 | |||
*200 mm wafer: 1-25 | |||
| | |||
*Chips: several | |||
*50 mm wafer: several | |||
*100 mm wafer: 1-25 | |||
*150 mm wafer: 1-25 | |||
*200 mm wafer: 1-25 | |||
| | | | ||
1-25 | *100 mm wafer: 1-25 | ||
*150 mm wafer: 1-25 | |||
| | | | ||
1-25 wafer | *100 mm wafer: 1-25 | ||
*150 mm wafer: 1-25 | |||
|- | |- | ||
| | ! scope=row style="text-align: left;" | Substrate materials | ||
| | | | ||
*<span style="color:red">'''No polymer substrates'''</span><br> | |||
*Silicon substrates | |||
*III-V substrates | |||
*Glass substrates | |||
*Films, or patterned films, of any material except type IV (Pb, Te) | |||
| | | | ||
*<span style="color:red">'''No metals'''</span><br> | |||
|- | *<span style="color:red">'''No metal oxides'''</span><br> | ||
|''' | *<span style="color:red">'''No III-V materials'''</span><br> | ||
*Silicon substrates | |||
*Glass substrates | |||
*Polymer substrates | |||
*Films, or patterned films, of resists/polymers | |||
| | |||
*Silicon substrates | |||
*III-V substrates (only on Si carrier) | |||
*Glass substrates | |||
*Polymer substrates | |||
*Films, or patterned films, of any material except type IV (Pb, Te) | |||
| | |||
*<span style="color:red">'''No iron (Fe) containing films'''</span> | |||
*Silicon substrates | |||
*III-V substrates | |||
*Glass substrates | |||
*Polymer substrates | |||
*Films, or patterned films, of any material except type IV (Pb, Te) | |||
| | | | ||
*Silicon | *<span style="color:red">'''No iron (Fe) or Copper (Cu) containing films'''</span> | ||
* | *Silicon substrates | ||
* | *III-V substrates (only if clean) | ||
* | *Glass substrates | ||
*Films, or patterned films, of any material except type IV (Pb, Te) | |||
|} | |||
=Decommisioned tools= | |||
<span style="color:red">Plasma asher 1 was decommissioned 2024-12-02.</span> | |||
[[Specific Process Knowledge/Lithography/Strip/PlasmaAsher1|Information about decommissioned tool can be found here.]] | |||
<span style="color:red">Plasma asher 2 was decommissioned 2024-12-02.</span> | |||
| | [[Specific Process Knowledge/Lithography/Strip/PlasmaAsher2|Information about decommissioned tool can be found here.]] | ||
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