Specific Process Knowledge/Lithography/UVLithography: Difference between revisions

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* '''Substrate pretreatment''': In many processes it is recommended to <u>[[Specific_Process_Knowledge/Lithography/Pretreatment|pretreat or prime]]</u> your wafer before spin-coating. In some <u>[[Specific_Process_Knowledge/Lithography/Coaters|spin-coaters]]</u>, these pretreatment processes are included in the spin coating of resist.  
* '''Substrate pretreatment''': In many processes it is recommended to <u>[[Specific_Process_Knowledge/Lithography/Pretreatment|pretreat or prime]]</u> your wafer before spin-coating. In some <u>[[Specific_Process_Knowledge/Lithography/Coaters|spin-coaters]]</u>, these pretreatment processes are included in the spin coating of resist.  


* '''Resist Type''': Choose the type of resist you wish to use: a list of UV lithography resist types available at DTU Nanolab can be found <u>[[Specific_Process_Knowledge/Lithography/UVLithography#Resist_Overview|on this page]]</u>.
* '''Resist Type''': Choose the type of resist you wish to use: a list of UV lithography resist types available at DTU Nanolab can be found <u>[[Specific_Process_Knowledge/Lithography/Resist/UVresist|on this page]]</u>.
** Positive tone resist: Resist exposed to UV light will be dissolved in the developer. The mask openings are an exact copy of the resist pattern which is to remain on the wafer.
** Positive tone resist: Resist exposed to UV light will be dissolved in the developer. The mask openings are an exact copy of the resist pattern which is to remain on the wafer.
** Negative tone resist: Resist exposed to UV light will become polymerized and difficult to dissolve. The mask openings are an inverse copy of the resist pattern which is to remain on the wafer.
** Negative tone resist: Resist exposed to UV light will become polymerized and difficult to dissolve. The mask openings are an inverse copy of the resist pattern which is to remain on the wafer.
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<br clear=all />
<br clear=all />
= Resist Overview =
{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;" width="90%"
|-
|-
|-style="background:silver; color:black"
|'''Resist'''
|width=100|'''Polarity'''
|'''Spectral sensitivity'''
|'''Manufacturer'''
|width=200|'''Comments'''
|width=100|'''Technical reports'''
|'''[[Specific_Process_Knowledge/Lithography/Coaters|Spin Coating]]'''
|'''[[Specific_Process_Knowledge/Lithography/UVExposure|Exposure]]'''
|'''[[Specific_Process_Knowledge/Lithography/Development|Developer]]'''
|'''Rinse'''
|width=100|'''Remover'''
|'''Process flows (in docx-format)'''
|-
|-
|-style="background:WhiteSmoke; color:black"
|'''[[Specific_Process_Knowledge/Lithography/5214E|AZ 5214E]]'''
|Positive but the image can be reversed
|310 - 420 nm
|[https://www.merckgroup.com/en/brands/pm/az-products.html Merck KGaA]
Supplied by [https://www.microchemicals.com/ MicroChemicals GmbH]
|Can be used for both positive and image reversed (negative) processes with resist thickness between 1 and 4 µm.
|[[media:AZ5214E.pdf‎|AZ5214E.pdf‎]]
[https://www.microchemicals.com/micro/tds_az_5214e_photoresist.pdf Photoresist AZ® 5214 E (TDS)]
|Automatic spin coater ([[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_UV|Gamma UV]] or [[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_E-beam_and_UV|Gamma e-beam & UV]])
Manual spin coater ([[Specific_Process_Knowledge/Lithography/Coaters#Manual_Spin_Coaters|LabSpin]] or [[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_RCD8|RCD8]])
|Mask aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#KS_Aligner|KS]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_MA6_-_2|MA6 - 2]])
Maskless aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_01|01]], [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_02|02]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_03|03]])
|AZ 351B developer
or
[[Specific_Process_Knowledge/Lithography/Development#Developer_TMAH_UV-lithography|AZ 726 MIF developer]]
|DI water
|Acetone or Remover 1165
|
Mask aligner:
[[media:‎Process_Flow_AZ5214E_pos_vers2.docx‎ |Process_Flow_AZ5214_pos.docx‎]]
[[media:Process_Flow_AZ5214E_rev_vers2.docx‎ |Process_Flow_AZ5214_rev.docx‎]]
Maskless aligner:
[[media:‎Process_Flow_AZ5214E_MLA_pos.docx‎ |Process_Flow_AZ5214_MLA_pos.docx‎]]
[[media:Process_Flow_AZ5214E_MLA_rev.docx‎ |Process_Flow_AZ5214_MLA_rev.docx‎]]
|-
|-style="background:LightGrey; color:black"
|'''[[Specific_Process_Knowledge/Lithography/4562|AZ 4562]]'''
|Positive
|310 - 440 nm
|[https://www.merckgroup.com/en/brands/pm/az-products.html Merck KGaA]
Supplied by [https://www.microchemicals.com/ MicroChemicals GmbH]
|For process with resist thickness between 6 and 25 µm.
|[[media:AZ4500.pdf‎|AZ4500.pdf‎]]
[https://www.microchemicals.com/micro/tds_az_4500_series.pdf Photoresist AZ® 4562 (TDS)]
|Automatic spin coater ([[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_E-beam_and_UV|Gamma e-beam & UV]])
Manual spin coater ([[Specific_Process_Knowledge/Lithography/Coaters#Manual_Spin_Coaters|LabSpin]] or [[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_RCD8|RCD8]])
|Mask aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#KS_Aligner|KS]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_MA6_-_2|MA6 - 2]])
Maskless aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_01|01]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_03|03]])
|AZ 351B developer
or
[[Specific_Process_Knowledge/Lithography/Development#Developer_TMAH_UV-lithography|AZ 726 MIF developer]]
|DI water
|Acetone or Remover 1165
|
Mask aligner:
[[media:Process_Flow_thick_AZ4562_vers2.docx‎|Process_Flow_thick_AZ4562.docx‎]]
Maskless aligner:
[[media:Process_Flow_thick_AZ4562_MLA.docx‎|Process_Flow_thick_AZ4562_MLA.docx‎]]
|-
|-style="background:WhiteSmoke; color:black"
|'''[[Specific_Process_Knowledge/Lithography/MiR|AZ MiR 701]]'''
|Positive
|310 - 445 nm
|[https://www.merckgroup.com/en/brands/pm/az-products.html Merck KGaA]
Supplied by [https://www.microchemicals.com/ MicroChemicals GmbH]
|High selectivity for dry etch.
Resist thickness 1.5 - 4 µm.
|[[media:AZ_MiR_701.pdf‎|AZ_MiR_701.pdf‎]]
[https://www.microchemicals.com/micro/tds_az_mir701_photoresist.pdf Photoresist AZ® MIR 701 (TDS)]
|Automatic spin coater ([[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_UV|Gamma UV]] or [[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_E-beam_and_UV|Gamma e-beam & UV]])
Manual spin coater ([[Specific_Process_Knowledge/Lithography/Coaters#Manual_Spin_Coaters|LabSpin]] or [[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_RCD8|RCD8]])
|
Mask aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#KS_Aligner|KS]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_MA6_-_2|MA6 - 2]])
Maskless aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_01|01]], [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_02|02]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_03|03]])
|[[Specific_Process_Knowledge/Lithography/Development#Developer_TMAH_UV-lithography|AZ 726 MIF developer]]
|DI water
|Acetone or Remover 1165
|
Mask aligner:
[[media:Process_Flow_AZ_MiR701.docx‎|Process_Flow_AZ_MiR701.docx‎]]
Maskless aligner:
[[media:Process_Flow_AZ_MiR701_MLA.docx‎|Process_Flow_AZ_MiR701_MLA.docx‎]]
|-
|-style="background:LightGrey; color:black"
|'''[[Specific_Process_Knowledge/Lithography/nLOF|AZ nLOF 2020]]'''
|Negative
|310 - 380 nm
|[https://www.merckgroup.com/en/brands/pm/az-products.html Merck KGaA]
Supplied by [https://www.microchemicals.com/ MicroChemicals GmbH]
|Negative sidewalls for lift-off.
Resist thickness 1.5 - 4 µm.
|[[media:AZ_nLOF_2020.pdf‎|AZ_nLOF_2020.pdf‎]]
[https://www.microchemicals.com/micro/tds_az_nlof2000_series.pdf Photoresist AZ®nLOF 2020 (TDS)]
|Automatic spin coater ([[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_UV|Gamma UV]])
Manual spin coater ([[Specific_Process_Knowledge/Lithography/Coaters#Manual_Spin_Coaters|LabSpin]] or [[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_RCD8|RCD8]])
|
Mask aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#KS_Aligner|KS]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_MA6_-_2|MA6 - 2]])
Maskless aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_01|01]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_02|02]])
|[[Specific_Process_Knowledge/Lithography/Development#Developer_TMAH_UV-lithography|AZ 726 MIF developer]]
|DI water
|Remover 1165
|
Mask aligner:
[[media:Process_Flow_AZ_nLOF_2020.docx‎|Process_Flow_AZ_nLOF_2020.docx‎]]
Maskless aligner:
[[media:Process_Flow_AZ_nLOF_2020_MLA.docx‎|Process_Flow_AZ_nLOF_2020_MLA.docx‎]]
|-
|-style="background:WhiteSmoke; color:black"
|'''[[Specific Process Knowledge/Lithography/SU-8|SU-8]]'''
|Negative
|350 - 400 nm
|[https://kayakuam.com/products/su-8-2000/ Kayaku Advanced Materials, Inc.]
Supplied by [http://www.microresist.com/products/ micro resist technology GmbH]
|High aspect ratio.
Resist thickness 1 µm to several 100 µm.
|[[media:SU-8_DataSheet_2005.pdf‎|SU-8_DataSheet_2005.pdf‎]], [[media:SU-8_DataSheet_2075.pdf‎|SU-8_DataSheet_2075.pdf‎]]
|Manual spin coater ([[Specific_Process_Knowledge/Lithography/Coaters#Manual_Spin_Coaters|LabSpin]] or [[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_RCD8|RCD8]])
|
Mask aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#KS_Aligner|KS]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_MA6_-_2|MA6 - 2]])
Maskless aligner ([[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_01|01]] or [[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_02|02]])
|[[Specific_Process_Knowledge/Lithography/Development#SU8-Developer|mr-Dev 600 developer (PGMEA)]]
|IPA
|Cured SU-8 is practically insoluble.
Plasma ashing can remove crosslinked SU-8.
|[[media:Process_Flow_SU8_70um.docx‎|Process_Flow_SU8_70um.docx‎]]
Most of the process knowledge on SU-8 is based in research groups
|}
===Other process flows===
*[[media:Process_Flow_ChipOnCarrier.docx‎|Process_Flow_ChipOnCarrier.docx‎]]: A procedure for UV lithography on a chip using automatic coater and developer.
<br clear="all" />


=Process information=
=Process information=

Revision as of 17:20, 26 January 2023

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UVLithography.jpg

UV Lithography uses ultraviolet light to transfer a pattern from a photo-mask or a design file to a wafer coated with photoresist. The photoresist film is spin coated onto the wafers, the design is transferred to the resist by using an aligner, and subsequently the resist pattern is developed. DTU Nanolab houses a number of automatic or manual coaters, mask or maskless aligners, as well as automatic or semi-automatic developers.

Getting started

UVLPic1.png
UVLPic2.png

Before you plan your UV processing and request for training on any equipment in UV lithography, please go through the following steps. Include the information in the training request.

Also, please remember that the Lithography Tool Package Training is mandatory before training in any lithography equipment.

If you are new to photolithography, you can visit this wikipedia webpage about photolithography before you start.

  • Prepare a process flow which describes all steps in your UV lithography process. You can find docx-templates in this table.
  • Design device: Design your device and layout. A detailed instruction on how to design a layout (mask) can be found here.
  • Substrate pretreatment: In many processes it is recommended to pretreat or prime your wafer before spin-coating. In some spin-coaters, these pretreatment processes are included in the spin coating of resist.
  • Resist Type: Choose the type of resist you wish to use: a list of UV lithography resist types available at DTU Nanolab can be found on this page.
    • Positive tone resist: Resist exposed to UV light will be dissolved in the developer. The mask openings are an exact copy of the resist pattern which is to remain on the wafer.
    • Negative tone resist: Resist exposed to UV light will become polymerized and difficult to dissolve. The mask openings are an inverse copy of the resist pattern which is to remain on the wafer.
  • Thickness of resist: In general, it is recommended to work at or below an aspect ratio of ~1, i.e. where the width of the pattern is larger than the thickness of the resist. Furthermore, when you decide the resist thickness, consider which transfer you need:
    • For lift-off processes, we recommend resist thickness at least 5 times larger than the thickness of the metal to be lifted.
    • For dry etch or wet etch processes, investigate the resist etch rate of your process as this might limit the minimum thickness of your resist.
  • Spin Coater: Do you wish to use a manual spin coater or an automatic spin coater? See a list of spin coaters here.
  • Exposure: Choose which aligner you wish to use, and consider the exposure dose.
    • You can find a list of mask aligners and maskless aligners here.
    • You can find information on dose here.
  • Mask: If you wish to use a mask aligner, order a photomask for your UV process. Instructions on how to order a photomask can be found here.
  • Development: Choose which equipment you wish to use to develop your photoresist from this list. Remember the development process influences the exposure dose.
  • Specify whether you wish to strip or lift-off your resist: strip and lift-off.


Process information

UV Resist

Pretreatment

Coating

Baking

UV Exposure

Development

Descum

Lift-off

Stripping Resist

Information from our suppliers

Application notes from MicroChemicals GmbH, e.g. Lithography Trouble-Shooter