Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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|+ Comparison between images of the Tip Checker sample | |+ Comparison between images of the Tip Checker sample | ||
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! | ! !! Worn Probe !! New probe | ||
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! Image | ! Image | ||
| [[File:AFMWornTip.jpg|thumb|left|alt=Image taken using a worn probe| AFM image of the tip checker sample taken using a wornAFM probe]] | | [[File:AFMWornTip.jpg|thumb|left|alt=Image taken using a worn probe| AFM image of the tip checker sample taken using a wornAFM probe]] | ||
| [[File:AFMNewTip.jpg|thumb|left|alt=Image taken using a new probe| AFM image of the tip checker sample taken using a new AFM probe]] | | [[File:AFMNewTip.jpg|thumb|left|alt=Image taken using a new probe| AFM image of the tip checker sample taken using a new AFM probe]] | ||
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! Image Parameters and | ! Image Parameters and | ||
Roughness information | Roughness information | ||
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* Size: 1µm | * Size: 1µm | ||
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! Comments | ! Comments | ||
| The shape of the probe causes all features to look like an oval pointing towards the top left of the image. Low measured roughness as the worn tip skates across the top of the triangles. | | The shape of the probe causes all features to look like an oval pointing towards the top left of the image. Low measured roughness as the worn tip skates across the top of the triangles. | ||
| Same sample taken with a new probe. The triangular structures are pointing in different directions, as expected based on SEM image. Higher measured roughness as the sharper tip can map the trenches between the triangles. | | Same sample taken with a new probe. The triangular structures are pointing in different directions, as expected based on SEM image. Higher measured roughness as the sharper tip can map the trenches between the triangles. | ||