Specific Process Knowledge/Characterization/XPS/NexsaOverview: Difference between revisions
Appearance
| Line 11: | Line 11: | ||
*'''Web of Science''': Click here to access the article in the Web of Science database (log on to WoS via DTU Inside in advance, click [http://www.webofknowledge.com.proxy.findit.dtu.dk/wos '''this link''' ] ). This will enable you to browse the cited references and citations of the article. | *'''Web of Science''': Click here to access the article in the Web of Science database (log on to WoS via DTU Inside in advance, click [http://www.webofknowledge.com.proxy.findit.dtu.dk/wos '''this link''' ] ). This will enable you to browse the cited references and citations of the article. | ||
*'''Abstract''': Hover the mouse over the text to show the abstract of the article. | *'''Abstract''': Hover the mouse over the text to show the abstract of the article. | ||
[[Template:Nexsa-addpubrow]] | |||
{{Template:Nexsa-tableheader}} | |||
| [[media:AN52109_E_Organic_LED_0411M_H_1.pdf | Multitechnique Surface Characterization of Organic LED Material]]||Application note||P Mack ||||X||X||||X||||||Organic LED's||<span title="Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron spectroscopy (UPS). XPS was used to analyze the surface composition of the material and by combining the information from REELS and UPS a full energy level diagram of the material was created using a single instrument."> Abstract</span> | | [[media:AN52109_E_Organic_LED_0411M_H_1.pdf | Multitechnique Surface Characterization of Organic LED Material]]||Application note||P Mack ||||X||X||||X||||||Organic LED's||<span title="Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron spectroscopy (UPS). XPS was used to analyze the surface composition of the material and by combining the information from REELS and UPS a full energy level diagram of the material was created using a single instrument."> Abstract</span> | ||