Specific Process Knowledge/Lithography/SU-8: Difference between revisions
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* exposure using radiation above 350 nm is recommended | * exposure using radiation above 350 nm is recommended | ||
* Controlled soft and post-exposure bakes are recommended and must be optimized for the specific application, but baseline parameters which can be used as a starting point will be given | * Controlled soft and post-exposure bakes are recommended and must be optimized for the specific application, but baseline parameters which can be used as a starting point will be given | ||
==Pretreatment== | ==Pretreatment== | ||