Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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=AFM Icon 1 & 2 = | =AFM Icon 1 & 2 = | ||
''This section is written by Berit Herstrøm @DTU Nanolab | |||
[[Image:P6180008.JPG|right|thumb|300px| AFM Icon-Pt Positioned in clean room: C-1, photo: DTU Nanolab internal]] | [[Image:P6180008.JPG|right|thumb|300px| AFM Icon-Pt Positioned in clean room: C-1, photo: DTU Nanolab internal]] | ||
[[Image:Foto of system in basement.jpg|right|thumb|300px| AFM Icon-Pt 2 Positioned in the basement of building 346-904, photo: DTU Nanolab internal]] | [[Image:Foto of system in basement.jpg|right|thumb|300px| AFM Icon-Pt 2 Positioned in the basement of building 346-904, photo: DTU Nanolab internal]] | ||