Specific Process Knowledge/Lithography/UVExposure: Difference between revisions
Appearance
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*Advanced Field Alignment Mode for alignment to individual chips/devices on the substrate | *Advanced Field Alignment Mode for alignment to individual chips/devices on the substrate | ||
*High Aspect Ratio Mode for exposure of thick resists | *High Aspect Ratio Mode for exposure of thick resists | ||
* | *200 x 200 mm exposure field | ||