LabAdviser/314/Microscopy 314-307: Difference between revisions
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| align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon_TEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/TEM|TEM ]] | | align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon_TEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/TEM|TEM ]] | ||
| align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM|SEM ]] | | align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM|SEM ]] | ||
| align="center" width="200px" | '''Dual-beam Electron Microscopy - FIB-SEM and PFIB-SEM''' [[image:Microscopy- | | align="center" width="200px" | '''Dual-beam Electron Microscopy - FIB-SEM and PFIB-SEM''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB|FIB ]] | ||
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