Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions

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	The main purposes are surface roughness measurements and step/structure high measurements in the nanometer and sub-micrometer regime. For larger structure see the [[Specific Process Knowledge/Characterization/Topographic measurement\|topografic measurement]] page.		The main purposes are surface roughness measurements and step/structure high measurements in the nanometer and sub-micrometer regime. For larger structure see the [[Specific Process Knowledge/Characterization/Topographic measurement\|topografic measurement]] page.

	To get some product information from the vendor take a look at Bruker's homepage [~~http~~://www.bruker~~-axs~~.com/~~atomicforcemicroscopy~~.html]		To get some product information from the vendor take a look at Bruker's homepage [https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-icon-afm.html]