Revision as of 12:05, 11 February 2022

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Electron Microscopy at DTU Nanolab building 314/307

At DTU Nanolab - building 314/307 are different types of microscopes available:


Transmission Electron Microscopy (TEM)	Scanning Electron Microscopy (SEM)	Dual-beam Electron Microcopes - FIB-SEM and PFIB-SEM

Depending on the equipment, different techniques are available:


X-Ray spectroscopy (EDS/WDS)	Electron Energy Loss Spectroscopy (EELS)	Energy Filtered TEM (EFTEM)
Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)	Electron Holography	Diffraction $Diffraction$


Available software at DTU Nanolab	Lattice fringe analysis	Remote Access for Staff

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 | align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/TEM|TEM ]]
 | align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/SEM|SEM ]]
-| align="center" width="200px" | '''Dual-beam Electron Microcopes - Focused Ion Beam and Scanning Electron Microscope (FIB-SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/FIB|FIB ]]
+| align="center" width="200px" | '''Dual-beam Electron Microcopes - FIB-SEM and PFIB-SEM''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/FIB|FIB ]]
 |}