Specific Process Knowledge/Characterization/Profiler: Difference between revisions
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All the profilers are compared on the [[Specific Process Knowledge/Characterization/Topographic measurement#Comparison_of_stylus_profilers.2C_optical_profilers_and_AFMs_at_Nanolab|topographic measurement]] page. | All the profilers are compared on the [[Specific Process Knowledge/Characterization/Topographic measurement#Comparison_of_stylus_profilers.2C_optical_profilers_and_AFMs_at_Nanolab|topographic measurement]] page. | ||
The sections below describe each profiler ( | The sections below describe each profiler (stylus profilers and optical profilers) in more detail. | ||
==Dektak XTA stylus profiler== | ==Dektak XTA stylus profiler== | ||