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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions

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Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,311 edits
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|style="background:WhiteSmoke; color:black"|Standard probe: <12 nm
|style="background:WhiteSmoke; color:black"|Standard probe: <12 nm
|style="background:WhiteSmoke; color:black"|Standard probe: <12 nm
|style="background:WhiteSmoke; color:black"|Standard probe: <12 nm
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|style="background:LightGrey; color:black"|Standard soft tapping mode Cantilever/tip (can be used in both tapping mode and ScanAsyst mode)
|style="background:WhiteSmoke; color:black"|[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in Air]
|style="background:WhiteSmoke; color:black"|[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in Air]
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|style="background:silver; color:black"|
|style="background:silver; color:black"|
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