Specific Process Knowledge/Characterization/XPS/NexsaOverview: Difference between revisions

Revision as of 10:15, 14 April 2020

Overview of the processing options on the XPS Nexsa

The acquisition of an instrument like the Nexsa has to be done through a EU tender process. As a somewhat unexpected result of this process, we were offered the Nexsa at a very favorable price. We were therefore able to squeeze all but one of the available options into the budget. That is, of course, very nice indeed, but it also means that we will have to investigate the applications of the various techniques as there is no applications waiting for a specific technique to become available.

We have therefore compiled the table below that contains articles and application notes in which several of the available techniques are used

The columns contain the following information (exclude are the columns where the content is evident):

Title: Click on the title to access a pdf version of the article/application note.
Web of Science: Click here to access the article in the Web of Science database (be sure to be logged in via DTU Inside in advance). This will enable you to browse the cited references and citations of the

Publication				Techniques and hardware applied						Sample types/Materials	Abstract: Hover cursor to show
Title	Type	Author	Web of Science	XPS	UPS	ISS	REELS	Raman	Additional options/hardware	Sample types/Materials	Abstract: Hover cursor to show
Multitechnique Surface Characterization of Organic LED Material	Application note	P Mack		X	X		X			Organic LED's	Abstract
Advantages of coincident XPS-Raman in the analysis of mineral oxides species	Application note			X				X		TiO2, CaCO3
Spectroscopic analysis of solid oxide fuel cell material with XPS	Application note	P Mack		X
Rapid XPS image acquisition using SnapMap	Application note	R Simpson		X					SnapMap
Composition, coverage and band gap analysis of ALD-grown ultra thin films	Application note	P Mack		X		X	X		Band gap	Gate dielectrics, HfO2, SiO2
Confirming the layer structure of an organic FET device	Application note	P Mack		X					MAGCIS	Organic FET's,
Surface analysis of zeolites: An XPS, variable kinetic energy XPS, and low energy ion scattering study	Publication	SR Bare	link	X		X				Zeolites, Metal oxides	Abstract
Surface composition analysis by low-energy ion scattering	Publication, background	H H Brongersma	link			X					Abstract
Monitoring surface metal oxide catalytic active sites with Raman spectroscopy	Publication, review	I E Wachs	link					X		Metal oxides	Abstract
Diffusion of In_0.53Ga_0.47As elements through hafnium oxide during post deposition annealing	Publication	W Cabrera	link	X		X			TEM	HfO2, InGaAs, ALD	Abstract
Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications	Publication, review	C V Cushman	link			X					Abstract
HfO2 on MoS2 by Atomic Layer Deposition: Adsorption Mechanisms and Thickness Scalability	Publication	S McDonnell	link	X		X			AFM, ALD	HfO2, MoS2	Abstract
Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS	Publication	S Prusa	link			X				graphene	Abstract
Reflection electron energy loss spectroscopy for ultrathin gate oxide materials	Publication	H C Shin	link	X			X		Valence band	HfZrO4,	Abstract
Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions	Publication	R Steinberger	link	X		X			AES, ARXPS, sputter profiles	Oxygen on metal surfaces	Abstract
Electrochemical Characterization and Quantified Surface Termination Obtained by Low Energy Ion Scattering and X-ray Photoelectron Spectroscopy of Orthorhombic and Rhombohedral LaMnO3 Powders	Publication	E Symianakis	link	X		X			XRD	Catalysts, LaMnO3	Abstract
The Thermal Oxidation of TiAlN High Power Pulsed Magnetron Sputtering Hard Coatings as Revealed by Combined Ion and Electron Spectroscopy	Publication	M Wiesing	link	X	X	X			Ar sputtering	TiAlN	Abstract
Electronic structure and energy band gap of poly(9,9-dioctylfluorene) investigated by photoelectron spectroscopy	Publication	L S Liao	link	X	X					Polymer	Abstract
Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS	Publication	Y R Denny	link	X			X				Abstract

@@ Line 1: / Line 1: @@
 == Overview of the processing options on the XPS Nexsa==
-The acquisition of an instrument like the Nexsa has to be done through a EU tender process. As a somewhat unexpected result of this process, we were offered the Nexsa at a very favorable price. We were therefore able to squeeze <span title="The only analytical option (that means excluded chillers, factory training courses, UPS etc) not chosen is a vacuum transfer module " > ''all'' </span> but one of the available options into the budget. That is, of course, very nice indeed, but we will have to investigate the applications of the various techniques as we don't have any applications waiting for a specific technique to become available.
+The acquisition of an instrument like the Nexsa has to be done through a EU tender process. As a somewhat unexpected result of this process, we were offered the Nexsa at a very favorable price. We were therefore able to squeeze <span title="The only analytical option (that means excluded chillers, factory training courses, UPS etc) not chosen is a vacuum transfer module " > ''all'' </span> but one of the available options into the budget. That is, of course, very nice indeed, but it also means that we will have to investigate the applications of the various techniques as there is no applications waiting for a specific technique to become available.
+We have therefore compiled the table below that contains articles and application notes in which several of the available techniques are used
-We have therefore compiled the table below.
+The columns contain the following information (exclude are the columns where the content is evident):
+* '''Title''': Click on the title to access a pdf version of the article/application note.
+*'''Web of Science''': Click here to access the article in the Web of Science database (be sure to be logged in via DTU Inside in advance). This will enable you to browse the cited references and citations of the
 {| border="2" cellspacing="0" cellpadding="1" {{table}}