Specific Process Knowledge/Characterization/XPS/NexsaOverview: Difference between revisions
No edit summary |
No edit summary |
||
| Line 24: | Line 24: | ||
| [[media:AN52110-spectroscopic-analysis-solid-oxide-fuel-cell-material-xps.pdf | Spectroscopic analysis of solid oxide fuel cell material with XPS]]||Application note||P Mack ||||X|||||||||||||| | | [[media:AN52110-spectroscopic-analysis-solid-oxide-fuel-cell-material-xps.pdf | Spectroscopic analysis of solid oxide fuel cell material with XPS]]||Application note||P Mack ||||X|||||||||||||| | ||
|- | |- | ||
| [[media:AN52330-rapid-xps-image-acquisition-using-snapmap | | [[media:AN52330-rapid-xps-image-acquisition-using-snapmap.pdf | Rapid XPS image acquisition using SnapMap]]||Application note||R Simpson||||X||||||||||SnapMap|||| | ||
|- | |- | ||
| [[media:AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf | Composition, coverage and band gap analysis of ALD-grown ultra thin films]]||Application note||P Mack ||||X||||X||X||||Band gap||Gate dielectrics, HfO2, SiO2|| | | [[media:AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf | Composition, coverage and band gap analysis of ALD-grown ultra thin films]]||Application note||P Mack ||||X||||X||X||||Band gap||Gate dielectrics, HfO2, SiO2|| | ||