Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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'''The user manual, quality control procedure and results and contact information can be found in LabManager:''' <br/> | '''The user manual, quality control procedure and results and contact information can be found in LabManager:''' <br/> | ||
[http://labmanager | [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=337 AFM Icon 1 in LabManager]<br> | ||
[http://labmanager | [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=438 AFM Icon 2 in LabManager] | ||
==Process Information== | ==Process Information== | ||
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*Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | *Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | ||
*or you can install Brukers own software analyses program that can be found on the cleanroom drive: U:\DCH\CleanroomDrive\_Equipment\AFM\NanoScope_Analysis_x86_v170r1sr2.exe | *or you can install Brukers own software analyses program that can be found on the cleanroom drive: U:\DCH\CleanroomDrive\_Equipment\AFM\NanoScope_Analysis_x86_v170r1sr2.exe | ||
*or you can get a SPIP license for free if you are connected one of the following institutes ( | *or you can get a SPIP license for free if you are connected one of the following institutes (Nanolab, Physics, Chemistry, Mechanics, Energikonvertering) , by contacting [mailto:jotri@adm.dtu.dk John Tandrup Riedel] | ||