Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
| Line 107: | Line 107: | ||
==Process Information== | ==Process Information== | ||
<!-- | |||
[[Image:Tap300Al-G.jpg|right|thumb|Std. tip Tap300Al-G]] | [[Image:Tap300Al-G.jpg|right|thumb|Std. tip Tap300Al-G]] | ||
[[Image:Tap300Al-G-schematic.png|right|thumb|Std. tip Tap300Al-G]] | [[Image:Tap300Al-G-schematic.png|right|thumb|Std. tip Tap300Al-G]] | ||
[[Image:SSS-NCHR-AFM-tip.jpg|right|thumb|SSS-NCHR tip<br /> (Super-Sharp-Silicon)]] | [[Image:SSS-NCHR-AFM-tip.jpg|right|thumb|SSS-NCHR tip<br /> (Super-Sharp-Silicon)]] | ||
[[Image:Nanoman cantilever AR5.jpg|right|thumb|AR5-NCHR tip<br /> (Aspect Ratio 5)]] | [[Image:Nanoman cantilever AR5.jpg|right|thumb|AR5-NCHR tip<br /> (Aspect Ratio 5)]] | ||
--> | |||
*For a tutorial on AFM see here: [http://www.doitpoms.ac.uk/tlplib/afm/index.php AFM] | *For a tutorial on AFM see here: [http://www.doitpoms.ac.uk/tlplib/afm/index.php AFM] | ||