Specific Process Knowledge/Thin film deposition/Deposition of Silicon Oxide: Difference between revisions
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*Excelent. Very high surface mobility. | *Excelent. Very high surface mobility. | ||
*Deposition on both sides of the substrate. | |||
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*Less good | *Less good | ||
*When doped with phosphorus and/or Boron the oxide can float at about 1000 <sup>o</sup>C in a wet oxidation. | *When doped with phosphorus and/or Boron the oxide can float at about 1000 <sup>o</sup>C in a wet oxidation. | ||
*Deposition on one side of the substrate | |||
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* | *Not known | ||
|Not Known | *Deposition on one side of the substrate | ||
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*Not Known | |||
*Deposition on one side of the substrate | |||
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!Substrate size | !Substrate size | ||
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* | *1-13 100 mm wafers | ||
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* | *Several small samples | ||
* | *1-7 50 mm wafers | ||
* | *1-3 100 mm wafers | ||
* | *1 150 mm wafer | ||
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*Several small samples | |||
*1-12 100 mm wafers | |||
*1-4 150 mm wafers | |||
*Process time for 3 wafers is the same as for 1 wafer | |||
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*Several small samples mounted with capton tape | |||
*1 50 mm wafer | |||
*1 100 mm wafer | |||
*1 150 mm wafer | |||
*1 200 mm wafer | |||
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