Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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| Same sample taken with a new probe. The triangular structures are pointing in different directions, as expected based on SEM image. Higher measured roughness as the sharper tip can map the trenches between the triangles. | | Same sample taken with a new probe. The triangular structures are pointing in different directions, as expected based on SEM image. Higher measured roughness as the sharper tip can map the trenches between the triangles. | ||
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===Tip Wear=== | |||
''This section is written by Jesper Pan @DTU Nanolab | |||
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