Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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===Analysis software=== | ===Analysis software=== | ||
*Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | *Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | ||
*or you can install Brukers own software analyses program that can be found on the cleanroom drive: U:\ | *or you can install Brukers own software analyses program that can be found on the cleanroom drive: U:\Nlab\CleanroomDrive\_Equipment\AFM\NanoScope_Analysis_x86_v170r1sr2.exe | ||
*or you can get a SPIP license for free if you are connected one of the following institutes (Nanolab, Physics, Chemistry, Mechanics, Energikonvertering, this list may not be updated!) , by contacting [mailto:cmisk@dtu.dk Christian Michael Skram] | *or you can get a SPIP license for free if you are connected one of the following institutes (Nanolab, Physics, Chemistry, Mechanics, Energikonvertering, this list may not be updated!) , by contacting [mailto:cmisk@dtu.dk Christian Michael Skram] | ||