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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions

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|style="background:silver; color:black"|
|style="background:silver; color:black"|
| style="background:LightGrey; color:black"|Substrate material allowed
| style="background:LightGrey; color:black"|Substrate material allowed
|style="background:WhiteSmoke; color:black"|In principle all materials
|style="background:WhiteSmoke; color:black"|In principle all solid and none-poisonous materials
|style="background:WhiteSmoke; color:black"|In principle all materials
|style="background:WhiteSmoke; color:black"|In principle all solid and none-poisonous materials
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