Specific Process Knowledge/Lithography/Coaters: Difference between revisions
Appearance
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|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
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|- | |||
|Silicon with native oxide | |Silicon with native oxide | ||
|1, | |1,399 | ||
| | |3,1% | ||
| | |28/1 2016 | ||
|chasil | |chasil | ||
|with HMDS. Average of 3 wafers | |with HMDS. Average of 3 wafers | ||
|- | |- | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|1, | |1,418 | ||
| | |2,5% | ||
| | |21/2 2016 | ||
|chasil | |chasil | ||
|with HMDS. Average of 3 wafers | |with HMDS. Average of 3 wafers | ||
|} | |} | ||