|
|
| (463 intermediate revisions by 10 users not shown) |
| Line 1: |
Line 1: |
| == UV Exposure Comparison Table ==
| | {{cc-nanolab}} |
|
| |
|
| | [[Category: Equipment|Lithography exposure]] |
| | [[Category: Lithography|Exposure]] |
|
| |
|
| {| border="2" cellspacing="0" cellpadding="2"
| | __TOC__ |
| | |
| !colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment
| |
| |style="background:WhiteSmoke; color:black"|<b>[[Specific_Process_Knowledge/Lithography/UVExposure#KS Aligner|KS Aligner]]</b>
| |
| |style="background:WhiteSmoke; color:black"|<b>[[Specific_Process_Knowledge/Lithography/UVExposure#EVG Aligner|EVG Aligner]]</b>
| |
| |style="background:WhiteSmoke; color:black"|<b>[[Specific_Process_Knowledge/Lithography/UVExposure#III-V Aligner|III-V Aligner]]</b>
| |
| |style="background:WhiteSmoke; color:black"|<b>[[Specific_Process_Knowledge/Lithography/UVExposure#Inclined UV Lamp|Inclined UV Lamp]]</b>
| |
|
| |
|
| | =UV Exposure Comparison Table= |
| | {| class="wikitable" |
| | |- |
| | ! |
| | ! [[Specific_Process_Knowledge/Lithography/UVExposure/aligner_MA6-1|Aligner: MA6-1]] |
| | ! [[Specific_Process_Knowledge/Lithography/UVExposure/aligner_MA6-2|Aligner: MA6-2]] |
| | ! [[Specific_Process_Knowledge/Lithography/UVExposure/aligner_MLA1|Aligner: Maskless 01]] |
| | ! [[Specific_Process_Knowledge/Lithography/UVExposure/aligner_MLA2|Aligner: Maskless 02]] |
| | ! [[Specific_Process_Knowledge/Lithography/UVExposure/aligner_MLA3|Aligner: Maskless 03]] |
| | ! [[Specific_Process_Knowledge/Lithography/UVExposure/aligner_MLA4|Aligner: Maskless 04]] |
| |- | | |- |
| !style="background:silver; width:100px; color:black;" align="center"|Purpose | | ! scope=row| Purpose |
| |style="background:LightGrey; color:black"| | | | |
| |style="background:WhiteSmoke; color:black"|
| | *Top side alignment |
| *TS and BS Alignment | | *Back side alignment |
| *UV exposure | | *UV exposure |
| |style="background:WhiteSmoke; color:black"|
| | NB: this tool is in PolyFabLab |
| *TS and BS Alignment | | | |
| *UV exposure | | *Top side alignment |
| |style="background:WhiteSmoke; color:black"| | | *Back side alignment |
| *TS Alignment | | *UV exposure |
| *UV exposure | | *Bond alignment |
| | | |
| | *Top side alignment |
| | *Maskless UV exposure |
| | | |
| | *Top side alignment |
| | *Back side alignment |
| | *Maskless UV exposure |
| | | | | |
| | | *Top side alignment |
| |-
| | *Back side alignment |
| !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Performance
| | *Maskless UV exposure |
| |style="background:LightGrey; color:black"|Minimum feature size
| |
| |style="background:WhiteSmoke; color:black"|
| |
| *1.25µm down to 1.0µm | |
| |style="background:WhiteSmoke; color:black"|
| |
| *1.25µm | |
| |style="background:WhiteSmoke; color:black"|
| |
| | | | | |
| | | *Top side alignment |
| | *Maskless UV exposure |
| | *Direct laser writing |
| | NB: this tool is in PolyFabLab |
| |- | | |- |
| |style="background:LightGrey; color:black"|Exposure light/filters/spectrum
| | ! scope=row| Minimum feature size |
| |style="background:WhiteSmoke; color:black"| | | | ~1 µm || ~1 µm || ~1 µm || ~1 µm || ~1 µm || ~1 µm |
| * 350W Hg-lamp, 365nm filter, 303nm filter optional
| |
| * intensity in Constant Intensity(CI) mode 7mJ/cm2
| |
| |style="background:WhiteSmoke; color:black"| | |
| * 350W Hg-lamp, SU8 filter, 365nm filter optional
| |
| * intensity in Constant Intensity(CI) mode 7mJ/cm2
| |
| |style="background:WhiteSmoke; color:black"| | |
| *
| |
| |style="background:WhiteSmoke; color:black"| | |
| *
| |
| | |
| |- | | |- |
| |style="background:LightGrey; color:black"|Exposure mode
| | ! scope=row| Alignment accuracy |
| |style="background:WhiteSmoke; color:black"| | | | |
| *proximity, soft, hard, vacuum contact | | *TSA: ±2 µm |
| |style="background:WhiteSmoke; color:black"| | | *BSA: ±5 µm |
| *proximity, soft, hard, vacuum contact | | | |
| *proximity, soft, hard, vacuum contact | | *TSA: ±1 µm |
| |style="background:WhiteSmoke; color:black"| | | *BSA: ±2 µm |
| * | | | |
| |style="background:WhiteSmoke; color:black"| | | ±2 µm<br>(±1 µm possible) |
| *
| | | |
| | | *TSA: ± 0.5 µm |
| | *BSA: ± 1 µm |
| | | |
| | *TSA: ± 0.5 µm |
| | *BSA: ± 1 µm |
| | | |
| | ±1 µm |
| |- | | |- |
| !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Process parameter range | | ! scope=row| Exposure light source |
| |style="background:LightGrey; color:black"|Positive Process | | | |
| |style="background:WhiteSmoke; color:black"|
| | *350 W Hg lamp |
| * | | *i-line filter (365nm band pass filter) |
| |style="background:WhiteSmoke; color:black"| | | | |
| * | | *500 W Hg-Xe lamp |
| |style="background:WhiteSmoke; color:black"| | | *i-line filter (365nm band pass filter) |
| *
| | | |
| |style="background:WhiteSmoke; color:black"| | | 365 nm LED |
| * | | | |
| | | 375 nm laser diode array |
| | | |
| | 405 nm laser diode array |
| | | |
| | *365 nm LED |
| | *405 nm laser diode |
| |- | | |- |
| |style="background:LightGrey; color:black"|Negative Process
| | ! scope=row| Exposure mode |
| |style="background:WhiteSmoke; color:black"| | | | |
| * | | *Flood exposure |
| |style="background:WhiteSmoke; color:black"| | | *Proximity |
| * | | *Contact: |
| |style="background:WhiteSmoke; color:black"| | | **Soft contact |
| * | | **Hard contact |
| |style="background:WhiteSmoke; color:black"| | | **Vacuum contact |
| * | | | |
| | | *Flood exposure |
| | *Proximity |
| | *Contact: |
| | **Soft contact |
| | **Hard contact |
| | **Vacuum contact |
| | | |
| | *Projection: |
| | **Pneumatic auto-focus |
| | | |
| | *Projection: |
| | **Optical auto-focus |
| | **Pneumatic auto-focus |
| | | |
| | *Projection: |
| | **Pneumatic auto-focus |
| | | |
| | *Projection: |
| | **Optical auto-focus |
| | **Pneumatic auto-focus |
| | *Direct laser writing: |
| | **Optical auto-focus |
| | **Pneumatic auto-focus |
| |- | | |- |
| !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | | ! scope=row| Batch size |
| |style="background:LightGrey; color:black"|Batch size
| | | 1 || 1 || 1 || 1 || 1 || 1 |
| |style="background:WhiteSmoke; color:black"| | |
| *<nowiki>1</nowiki> small samples
| |
| *<nowiki>1</nowiki> 50 mm wafers
| |
| *<nowiki>1</nowiki> 100 mm wafers
| |
| *<nowiki>1</nowiki> 150 mm wafers
| |
| |style="background:WhiteSmoke; color:black"| | |
| *<nowiki>1</nowiki> 50 mm wafers
| |
| *<nowiki>1</nowiki> 100 mm wafers
| |
| *<nowiki>25</nowiki> 150 mm wafers with automatic handling
| |
| |style="background:WhiteSmoke; color:black"| | |
| *<nowiki>1</nowiki> small samples
| |
| *<nowiki>1</nowiki> 50 mm wafers
| |
| *<nowiki>1</nowiki> 100 mm wafers
| |
| *<nowiki>1</nowiki> 150 mm wafers
| |
| |style="background:WhiteSmoke; color:black"| | |
| *
| |
| |- | | |- |
| | style="background:LightGrey; color:black"|Allowed materials
| | ! scope=row| Allowed materials |
| |style="background:WhiteSmoke; color:black"| | | | All PolyFabLab materials |
| *Si and silicon oxide, silicon nitride
| | | |
| *Quartz, pyrex
| | *All cleanroom materials except copper and steel |
| |style="background:WhiteSmoke; color:black"|
| | *Dedicated chuck for III-V materials |
| *Si and silicon oxide, silicon nitride | | | All cleanroom materials |
| *Quartz, pyrex
| | | All cleanroom materials |
| |style="background:WhiteSmoke; color:black"|
| | | All cleanroom materials |
| *III-V compounds | | | All PolyFabLab materials |
| |style="background:WhiteSmoke; color:black"| | |
| *
| |
| |-
| |
| |}
| |
| | |
| <br clear="all" />
| |
| | |
| == KS Aligner ==
| |
| | |
| [[Image:KSaligner.jpg|300x300px|thumb|The KSaligner MA6 is placed in Cleanroom 3.]]
| |
| SUSS Mask Aligner MA6 is designed for high resolution photolithography.
| |
| The 365nm exposure wavelength version is capable of 1.25 (1.0) um resolution in vacuum contact. All contact exposure programs (vacuum, hard, soft, proximity) are supplied.
| |
| Two alignment options are available: top side alignment (TSA) with a split field or a video microscope and back side alignment (BSA) with BSA microscope. It is also possible to make IR- light alignment.
| |
| | |
| '''The user manual(s), quality control procedure(s) and results and contact information can be found in LabManager:'''
| |
| Equipment info in [http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=44 LabManager]
| |
| | |
| <br clear="all" />
| |
| | |
| == EVG Aligner ==
| |
| | |
| [[Image:EVG620.jpg|300x300px|thumb|left|Aligner-6inch EVG620 is placed in Cleanroom 13.]]
| |
| EVG620 aligner is designed for high resolution photolithography.
| |
| The machine can be used for 2, 4 and 6 inch substrates. Cassette-to-cassette handling option is available only for 6inch substrates.
| |
| The automatic pattern recognition software is available for the special alignment marks design recommended of EVGroup. Please contact Danchip staff for further information.
| |
| Available exposure mode: proximity, soft, hard and vacuum contact.
| |
| Two alignment options are available: top side alignment (TSA) and back side alignment (BSA). IR-light alignment also an option.
| |
| | |
| '''The user manual(s), quality control procedure(s) and results and contact information can be found in LabManager:'''
| |
| Equipment info in [http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=201 LabManager]
| |
| | |
| | |
| <br clear="all" />
| |
| | |
| == III-V Aligner ==
| |
| | |
| The SÜSS MicroTec MA1006 mask aligner located in the III-V cleanroom is dedicated for processing of III-V compound semiconductors.
| |
| | |
| Specific use of the mask aligner can be found in the standard resist recipes.
| |
| | |
| [[Image:IMG_3078.jpg|300x300px|thumb|III-V Aligner positioned in III-V cleanroom ]]
| |
| | |
| {| border="2" cellspacing="0" cellpadding="10"
| |
| |-
| |
| !style="background:silver; color:black" align="left" valign="top" rowspan="6"|Performance
| |
| |style="background:LightGrey; color:black"|substrate size
| |
| |style="background:WhiteSmoke; color:black"|
| |
| small pieces 1x1 cm up to 2inch"
| |
| |-
| |
| |style="background:LightGrey; color:black"|Exposure mode
| |
| |style="background:WhiteSmoke; color:black"|
| |
| soft contact, hard contact, proximity, flood exposure
| |
| |-
| |
| | style="background:LightGrey; color:black"|Exposure light/filters
| |
| |style="background:WhiteSmoke; color:black"|
| |
| 365 nm, 405 nm
| |
| |-
| |
| |style="background:LightGrey; color:black"|Minimum structure size
| |
| |style="background:WhiteSmoke; color:black"|
| |
| ~1µm
| |
| |-
| |
| |style="background:LightGrey; color:black"|Mask size
| |
| |style="background:WhiteSmoke; color:black"|
| |
| 5x5inch
| |
| |- | | |- |
| |style="background:LightGrey; color:black"|Alignment modes
| |
| |style="background:WhiteSmoke; color:black"|
| |
| Top side only
| |
| |-
| |
| |} | | |} |
|
| |
|
| | =Mask vs Maskless aligners= |
| | Comparison study between mask aligners and maskless aligners can be found [[Specific_Process_Knowledge/Lithography/Aligners/MAvsMLA|here]]. |
|
| |
|
| <br clear="all" /> | | =Decommisioned tools= |
| | | <span style="color:red">Inclined UV lamp was decommissioned 2023.</span> |
| ==Inclined UV lamp==
| |
| [[Image:Inclined UV lamp_1.jpg|200×200px|left|thumb|Inclined UV lamp is placed in Cleanroom 13.]]
| |
| | |
| The Inclined UV lamp is 1000 W Hg(Xe)lamp source designed for near UV, 350-450nm, mid UV, 260-320nm, and deep UV, 220-260nm exposures of resists and polymers. The exposure source can be also used to make an inclined exposure in air or in the media tank.
| |
| | |
| The toll was purchased in February 2009 from Newport company. The exposure lamp has a official name: Oriel Flood Exposure Source, unit 92540. All other parts of equipment: substrate and mask holder with media tank, exhaust box around the tool, timer controller, were designed and build at Danchip workshop.
| |
| | |
| The substrate and mask holder with a media tank was designed as part of Master Thesis of DTU Nanotech, Andres Kristensen group. The exhaust box was made as part of safety and the timer controller was build to control exposure time.
| |
| | |
| The technical specification and the general outline of the equipment can be found in LabManager.
| |
|
| |
|
| '''The user manual(s), quality control procedure(s) and results and contact information can be found in LabManager:'''
| | [[Specific Process Knowledge/Lithography/UVExposure/aligner_inclinedUV|Information about decommissioned tool can be found here.]] |
| Equipment info in [http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&page_id=169 LabManager]
| |