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The XPS Nexsa offers a variety of surface analysis techniques in addition to its main XPS technique.
The XPS Nexsa offers a variety of surface analysis techniques in addition to its main XPS technique.


[[Image:NexsaOverview.PNG |frame|x300px|The XPS Nexsa.]]
[[Image:XPS Nexsa instrument.jpg |thumb|300px|The XPS Nexsa.]]




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*[[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]]
*[[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]]
*[[Specific Process Knowledge/Characterization/XPS/UPS technique|Ultraviolet Photoelectron Spectroscopy or UPS]]
*[[Specific Process Knowledge/Characterization/XPS/UPS technique|Ultraviolet Photoelectron Spectroscopy or UPS]]
*[[Specific Process Knowledge/Characterization/XPS/NexsaOverview|Table with a set of publications in which multiple techniques are used]]


'''Specific measurements'''
'''Specific measurements'''


 
The Nexsa will allow you to characterize the sample in many ways. The list of parameters that can be determined are:
The Nexsa is capable of measuring a lot of  
; Work function
; Work function measurements
: Based on the measurements of the Fermi Level and the spectrum energy cut-off in a UPS spectrum, the work function may be measured. The Nexsa manual section 3.6.x has more information.
: Based on the measurements of the Fermi Level and the spectrum energy cut-off in a UPS spectrum, the work function may be measured. The Nexsa manual section 3.6.x has more information.
; Band gap measurements
; Band gap measurements
:
: Based on the REELS spectra the band gap may be determined.
; Mapping electronic bands using Angle resolved XPS (ARXPS) and UPS (ARUPS)
; Electronic band structure
: The Nexsa is capable of measuring the following
: Using Angle resolved XPS (ARXPS) and UPS (ARUPS) the electronic band structure may be mapped.
 
 
*[[Specific Process Knowledge/Characterization/XPS/NexsaOverview|Table with a set of publications in which multiple techniques are used]]


== Getting access to the XPS ==
== Getting access to the XPS ==
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/XPS/Nexsa"