Specific Process Knowledge/Thin film deposition/Temescal
Feedback to this page: click here
Unless otherwise stated, this page is written by DTU Nanolab internal
E-Beam Evaporator (Temescal)
The E-beam evaporator (Temescal) is a system for depositing metals by electron-beam evaporation. In e-beam evaporation, the deposition is line-of-sight directed from the source, which means it will coat only the surface of the sample facing directly towards the source. This makes it very useful for example for lift-off. This particular machine is made by Temescal, a division of FerroTec, and was purchased by Nanolab in 2018. It is very similar to the newer e-beam evaporator we have from the same manufacturer, bought in 2023, which we call E-beam Evaporator (10-pockets) in the LabManager system.
A special feature of the older machine - the E-beam evaporator (Temescal) - is that it has an ion source for in-situ Argon sputtering that can be used either for cleaning samples prior to deposition or to modify the film during deposition.
In both Temescal e-beam evaporators, wafers are loaded into the top of the chamber, which acts as a loadlock as it can be separated from the rest of the chamber by a large gate valve. Deposition will happen on all samples that are loaded together. You can load up to four 6" wafers or three 8" wafers for deposition on surfaces facing the evaporation source, or on up to one 6" wafer for tilted deposition. By using sample holder inserts, you can deposit metals on samples of different sizes and shapes. Only one metal can be deposited at a time, but you can deposit many layers of different metals one after the other. The system contains 6 metals at a time and the metals are exchanged based on user requests, so please request the metals you wish well in advance.
The user manual, user APV, and contact information can be found in LabManager:
E Beam Evaporator (Temescal) in LabManager
Training videos may be found here:
Process information
- Acceptance Test. Describes thickness uniformity tests, side wall deposition tests, sheet resistance tests and tests of the ion source for substrate cleaning.
Materials for e-beam evaporation
Aluminium (Al) ,Chromium (Cr) ,Copper (Cu) ,Germanium (Ge) ,Gold (Au) ,Molybdenum (Mo) ,Nickel (Ni) ,Niobium (Nb) ,Palladium (Pd) ,Platinum (Pt) ,Silver (Ag) ,Tantalum (Ta) ,Tin (Sn) ,Titanium (Ti) ,Tungsten (W) - thinner layers
Note that to date (May 2022) we have processes available for deposition of Al, Cr, Cu, Ge, Au, Ni, Nb, Pd, Pt, Ag, Ti, W and Ta as well as Ru. If your favorite metal is not available we may be able to buy a target and develop a recipe, just ask.
Thickness measurement, deposition rate and process control
Read about how the machine measures the thickness of the growing film using a quartz crystal monitor, how accurately you can control the rate/thickness, and other useful information about e-beam deposition here: Thickness, rate, process control.
Particulates in the films
Read about optimizing film quality including how to minimize the number of particulates in Au films in the Temescal.
| Purpose | Deposition of metals |
|
|---|---|---|
| Performance | Film thickness |
|
| Deposition rate |
| |
| Thickness uniformity |
| |
| Thickness accuracy |
| |
| Process parameter range | Process Temperature |
Higher for refractive metals that require a lot of heat to evaporate, see above. |
| Process pressure |
| |
| Source-substrate distance |
| |
| Substrates | Batch size |
|
| Substrate material allowed |
| |
| Material allowed on the substrate |
|
* For thicknesses above 600 nm please request permission so we can ensure that enough material will be present.
** Defined as the ratio of the standard deviation to the average of the measurement made using the DektakXT. For further details see the acceptance test.