Specific Process Knowledge/Characterization/XRD/XRD Powder
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The XRD Powder setup
The "XRD powder" is a benchtop X-ray diffractometer from Panalytical for phase analysis of powders. It is easy to use and offers the option of making measurements while heating the sample in a N2 atmosphere. The instrument is located in the basement of building 346 at Nanolab, Room 904.
The user manual(s), user APV(s), technical information, and contact information can be found in LabManager:
Software
After making a measurement, you will need dedicated software for the data export and analysis.
For data export
On the Cleanroom drive you can find the DataViewer software, which is a very basic program that allows you to view your measurement results and export to other formats, e.g., csv or txt. To install DataViewer, go to the folder O:\CleanroomDrive\_Equipment\XRD Powder\XRD Aeris\XRDMP and click "setup" (XRDMP stands for XRD Measurement Program). This will open a menu that allows you to install both DataViewer and XRDMP Creator. Just choose to install DataViewer. XRDMP Creater is only needed if you have made an agreement with the equipment responsible that you are allowed to create your own measurement routines.
For data analysis
We have a license for the software "HighScore" for Rietveld refinement, allowing quantification of the phase composition. This is so far only available on the support computer by the instrument, but will become available on a remote computer.
Additional software for measurements in a heated atmosphere
If you are going to make measurements in a heated N2 atmosphere, you will need the Nambicon software to control the heater. It is found in the folder O:\CleanroomDrive\_Equipment\XRD Powder\XRD Aeris\Anton Paar Nambicon.
Measurements
This setup allows you to make X-ray diffraction measurements in Bragg-Brentano mode (i.e., Theta-2Theta measurements where the incident and diffraction arms of the goniometer are coupled). We have a very limited selection of optics for this instrument, so there is little that the user can adjust.
It is possible to mount a special sample holder for heating the sample during the measurement. Please contact the equipment responsible to ask about this option.
| Equipment | XRD Powder | |
|---|---|---|
| Purpose | Crystal structure analysis and thin film thickness measurement |
|
| X-ray generator |
Maximum rated output |
600 W |
|
Rated tube voltage |
40 kV | |
|
Rated tube current |
15 mA | |
|
Type |
Sealed tube | |
|
Target |
Cu | |
|
Focus size |
0.4 mm x 12 mm (Line) | |
| Goniometer |
Scanning mode |
incident / receiver coupled |
|
Goniomenter radius |
145 mm | |
|
Minimum step size |
0.001° (3.6") | |
|
Sample stage |
Fixed with rotation | |
|
Sample size |
Powders | |
| Optics | Incident side |
|
| Receiver side |
| |
| Substrates | Measurement temperature |
May be heated in N2 up to 500 °C |
| Substrate size |
Only for powders | |
| Allowed materials |
All materials have to be approved | |