Specific Process Knowledge/Characterization/XRD/XRD Powder

From LabAdviser
Jump to navigation Jump to search

Feedback to this page: click here

Unless otherwise stated, this page is written by DTU Nanolab internal
All images and photos on this page belongs to DTU Nanolab

The XRD Powder setup

The XRD Powder located in the basement of building 346 at Nanolab, Room 904.

The "XRD powder" is an Aeris Research edition benchtop X-ray diffractometer from Malvern Panalytical. It is meant for phase analysis of powders, is easy to use, and offers the option of making measurements while heating the sample in a N2 atmosphere. The setup allows X-ray diffraction measurements in Bragg-Brentano mode (i.e., Theta-2Theta measurements where the incident and diffraction arms of the goniometer are coupled). We have a very limited selection of optics for this instrument, so there is little that the user can adjust.

Please contact the equipment responsible if you would like to mount the special sample holder for heating during the measurement.

The user manual(s), user APV(s), technical information, and contact information can be found in LabManager:

XRD Powder in LabManager - requires login


Process information

  • Malvern Panalytical has a large collection of webinars on XRD. You have to register to view them but the amount of email you receive afterwards is modest, so it's worth it in my opinion (Rebecca, July 2022). Some useful webinars include:

Software

To adjust measurement parameters and analyze the data, you will need dedicated software which is described here: XRD Powder software

Equipment performance and process related parameters

Equipment XRD Powder
Purpose Crystal structure analysis
  • Phase ID
  • Crystal Size
  • Crystallinity
X-ray generator

Maximum rated output

600 W

Rated tube voltage

40 kV

Rated tube current

15 mA

Type

Sealed tube

Target

Cu

Focus size

0.4 mm x 12 mm (Line)

Goniometer

Scanning mode

incident / receiver coupled

Goniomenter radius

145 mm

Minimum step size

0.001° (3.6")

Sample stage

Fixed with rotation

Optics Incident side
  • 0.04° soller slit
  • Ni and Cu filter
  • Divergence slits
  • Beam mask
Receiver side
  • 0.04° soller slit
  • Ni filter
Substrates Measurement temperature

May be heated in N2 up to 500 °C

Substrate size

Only for powders

Allowed materials

All materials have to be approved