Specific Process Knowledge/Characterization/Optical microscope
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It is possible to make an automated scanning of a full wafer on the Nikon Eclipse L200 with motorized stage Nikon Eclipse L200 auto scan guide
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Microscope | Location | Responsible Group | Objectives | Ocular | Special features | Features | Camera | Analysis software |
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Nikon SMZ 1000![]() |
346-901 | Wet chemistry | Zoom 0.8x - 8x | 10x | Stereoscopic microscope | Episcopic | No | No |
Noco IR![]() ![]() |
346-901 | Wet chemistry |
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10x | IR imaging |
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IR camera | No |
Leica INM100![]() |
346-901 | Wet chemistry |
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10x |
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DS-Fi2 | NIS-D | |
Nikon Eclipse L200 #2![]() ![]() |
C1 | Thin Film |
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10x |
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DS-Fi1 | NIS-D | |
Zeiss Jenatech![]() ![]() |
C1 | Thin Film |
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10x |
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No | No | |
Nikon Eclipse L200 #1![]() ![]() |
D3 | Thin Film |
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10x |
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DS-Fi1 | NIS-BR |
Leitz Medilux![]() |
D3 | Thin Film |
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10x |
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DX40-274FW | Kappa Control Center | |
Nikon Eclipse L200N #3![]() |
E4 | Lithography |
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10x |
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NIS-D | |
Nikon Eclipse L200N #4![]() |
E5 | Lithography |
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10x |
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NIS-D | |
Nikon ME 600![]() ![]() |
F1 | Thin Film |
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10x |
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DS-Fi2 | NIS-D | |
Leica S8 APO![]() |
F2 | Thin Film | Zoom 1x - 8x | 10x | Stereoscopic microscope | Episcopic | No | No |
Zeiss Axiotron![]() ![]() |
F3 | Lithography |
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10x |
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Infinity X | DeltaPix |
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Nikon SMZ 1000 | Noco IR | Leica INM 100 | Nikon Eclipse L200 #2 | Zeiss Jenatech | Nikon Eclipse L200 #1 | Leitz Medilux | Nikon Eclipse L200N #3 | Nikon Eclipse L200N #4 | Nikon ME 600 | Leica S8 APO | Zeiss Axiotron | |
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Location | 346-901 | 346-901 | 346-901 | C1 | C1 | D3 | D3 | E4 | E5 | F1 | F2 | F3 |
Responsible group | Wet chemistry | Wet chemistry | Wet chemistry | Thin Film | Thin Film | Thin Film | Thin Film | Lithography | Lithography | Thin Film | Thin Film | Lithography |
Objectives | Zoom 0.8x - 8x |
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Zoom 1x - 8x |
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Ocular | 10x | 10x | 10x | 10x | 10x | 10x | 10x | 10x | 10x | 10x | 10x | 10x |
Special features | Stereoscopic microscope | IR imaging |
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Stereoscopic microscope | ||||||||
Contrast mechanisms |
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Illumination modes |
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Camera | None | IR camera | DS-Fi2 | DS-Fi1 | None | DS-Fi1 | DX40-274FW |
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DS-Fi2 | None | Infinity X |
Analysis software | None | None | NIS-D | NIS-D | None | NIS-BR | Kappa Control Center | NIS-D | NIS-D | NIS-D | None | DeltaPix |