LabAdviser/314/Microscopy 314-307/SEM/Nova/Transmission Kikuchi diffraction

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he FEI Nova 600 NanoSEM Scanning Electron Microscope is a very versatile characterization instrument that produces enlarged images of a variety of specimens, achieving magnifications of over 500.000 times providing ultra high resolution imaging. At the time being this microscope is mainly designated for microstructural characterization using electron backscatter diffraction (EBSD) , Energy-dispersive X-ray spectroscopy (EDS) and forward scatter electron imaging by detect

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