Specific Process Knowledge/Thermal Process/RTP Jipelec 2

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Jipelec - Rapid Thermal Processing

Jipelec RTP: Positioned in cleanroom A-4


Jipelec JetFIRST 200 RTP (Rapid Thermal Processer/Annealer).

The main purpose of the machine is to anneal different samples very rapidly, or the machine can be used for alloying.

The machine consists of a process chamber, in which the annealing is done. Samples are placed on quartz pins, either on a graphite sucseptor or, Si dummy wafer or directly in the chamber in the process chamber.

Samples can be 6", 4" wafers or smaller samples made of different materials. In chamber, ht ehte

The maximum annealing temperature is 1200 C, and the heating is done by infrared lamps. Important: check the temperature limits in the table below.

Annnealings can be done at atmospheric pressure or in vacuum. It is also possible to apply a flow of either nitrogen or argon during the annealing.

In the chamber, sample are placed on quartz pins in the bottom of the chamber. 4" and 6" Si wafers can be placed directly on the quartz pins as show in the next picture, or these can be placed on a graphite susceptor. Smaller wafer and smaller samples can be placed on a Si dummy wafer or a graphite susceptor.

The


The Jipelec is a rapid thermal processing (RTP) oven. It is be used for fast and well-controlled annealing or alloying of samples. It is possible to use either a thermocouple or a pyrometer to control the temperature (of the sample carrier).


The user manual, technical information and contact information can be found in LabManager:

Jipelec RTP

Overview of the performance of the Jipelec RTP and some process related parameters

Purpose RTP annealing
Process parameter range Process Temperature
  • 0-1100 oC
  • III-V materials only to 450 oC
  • Temperature ramp up to 300 oC/min
Process pressure
  • 1 atm
  • Vacuum
Gases on the system
  • N2
Substrates Batch size
  • One 50 mm or 100 mm wafer
  • Small samples (placed on a carbide carrier or a Si carrier wafer with 1 µm oxide)
Substrate materials allowed

A carrier is always needed: For III-V materials a carbide carrier is used, and for other samples a silicon carrier wafer with 1 µm oxide is used

  • Silicon
  • Silicon oxide
  • Silicon nitride
  • Fused silica/quartz
  • Polysilicon
  • III-V materials (on graphite carrier, max 450 oC)
  • Some metals - Ask the Thin Film group for permission