Specific Process Knowledge/Lithography/Aligners/MAvsMLA: Difference between revisions
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| colspan="2" | Linewidth and sidewall angle vs. defocus value for 2µm AZ nLOF exposed in Aligner: Maskless 01 (MLA1) using dose 220mJ/cm<sup>2</sup> and Aligner: Maskless 02 (MLA2) using dose 450mJ/cm<sup>2</sup>, respectively. <br>Blue circles: Width of 2µm line. Orange Squares: Sidewall angle. | | colspan="2" | Linewidth and sidewall angle vs. defocus value for 2µm AZ nLOF exposed in Aligner: Maskless 01 (MLA1) using dose 220mJ/cm<sup>2</sup> and Aligner: Maskless 02 (MLA2) using dose 450mJ/cm<sup>2</sup>, respectively. <br>Blue circles: Width of 2µm line. Orange Squares: Sidewall angle. | ||
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| colspan="2" | Linewidth and sidewall angle vs. defocus value for 2µm AZ nLOF exposed in Aligner: Maskless 01 (MLA1) using dose 220mJ/cm<sup>2</sup> and Aligner: Maskless 02 (MLA2) using dose 450mJ/cm<sup>2</sup>, respectively. <br>Blue circles: Width of 2µm line. Orange Squares: Sidewall angle. | |||
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Revision as of 12:50, 16 June 2026
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Mask Aligner vs Maskless Aligner
Slides presented at NNUM in Uppsala 2026: MA6 vs MLA 2026_v09
Mask design used in the investigation: LithoTestAlign_2025_v10.gds
Additional data
THIS PAGE IS UNDER CONSTRUCTION
AZ 5214E
Resolution
Resolution at optimal processing conditions for 1.5µm AZ 5214E using different exposure equipment:
| Exposure equipment | Dose [mJ/cm2] | Contact/Defoc | Resolution [µm] | Comment |
|---|---|---|---|---|
| Aligner: MA6-2 | 100 | Vacuum | 1 | |
| Aligner: MA6-1 | 100 | Vacuum | 1.25 | Probably over-exposed |
| Aligner: Maskless 02 (MLA2) | 90 | 2 | 1.25 |
SEM images from different exposure equipment:
| 2µm triplets | Lines | Trenches | |
|---|---|---|---|
| Aligner: MA6-2
100mJ/cm2, vacuum contact |
|||
| Aligner: MA6-1
100mJ/cm2, vacuum contact |
|||
| Aligner: Maskless 02 (MLA2)
90mJ/cm2, defoc 2 |
SEM images of different size structures:
| 1µm triplets | 2µm triplets | 4µm triplets | |
|---|---|---|---|
| Aligner: MA6-1
100mJ/cm2, vacuum contact |
Yield
The yield is measured by inspecting all 116 lithographic resolution test structures in an optical microscope and recording the smallest resolved dots and lines.
Effect of exposure mode for mask aligner
Effect of WEC pressure for mask aligner (after WEC head service)
Resist profile
Linewidth and sidewall angle vs exposure dose
SEM images of 2µm triplets as a function of exposure dose:
| 85mJ/cm2 | 90mJ/cm2 | 95mJ/cm2 | 100mJ/cm2 | 105mJ/cm2 | |
|---|---|---|---|---|---|
| Aligner: MA6-2
Vacuum contact |
| 80mJ/cm2 | 90mJ/cm2 | 100mJ/cm2 | 110mJ/cm2 | |
|---|---|---|---|---|
| Aligner: Maskless 02 (MLA2)
Defoc 2 |
Result of image analysis of SEM images of 2µm triplets:
Linewidth and sidewall angle vs defocus parameter
SEM images as a function of defocus parameter for Aligner: Maskless 02 (MLA2) using dose 95mJ/cm2:
| Defoc -8 | Defoc -1 | Defoc 2 | Defoc 5 | Defoc 12 | |
|---|---|---|---|---|---|
| 2µm triplets | |||||
| Lines |
Result of image analysis of SEM images of 2µm triplets:
| Linewidth and sidewall angle vs. defocus value for 1.5µm AZ 5214E exposed in Aligner: Maskless 02 (MLA2) using dose 95mJ/cm2. Blue circles: Width of 2µm line. Orange Squares: Sidewall angle. |
AZ MiR 701
Resolution
- Table with optimal parameters and resolution for different aligners
- SEM pictures
Resolution at optimal processing conditions for 1.5µm AZ MiR 701 using different exposure equipment:
| Exposure equipment | Dose [mJ/cm2] | Contact/Defoc | Resolution [µm] | Comment |
|---|---|---|---|---|
| Aligner: MA6-2 | 220 | Vacuum | 1 | |
| Aligner: Maskless 02 (MLA2) | 275 | 2 | 1 |
Resist profile (sidewall angle and linewidth)
- SEM pictures to support graphs?
Result of image analysis of SEM images of 2µm triplets:
Result of image analysis of SEM images of 2µm triplets:
| Linewidth and sidewall angle vs. defocus value for 1.5µm AZ MiR 701 exposed in Aligner: Maskless 02 (MLA2) using dose 95mJ/cm2. Blue circles: Width of 2µm line. Orange Squares: Sidewall angle. |
AZ nLOF 2020
Resolution
- Table with optimal parameters and resolution for different aligners
- SEM pictures
Resolution at optimal processing conditions for 2µm AZ nLOF 2020 using different exposure equipment:
| Exposure equipment | Dose [mJ/cm2] | Contact/Defoc | Resolution [µm] | Comment |
|---|---|---|---|---|
| Aligner: MA6-2 | 154 | Vacuum | 1 | |
| Aligner: Maskless 01 (MLA1) | 220 | -4 | 2 | |
| Aligner: Maskless 02 (MLA2) | 450 | 0 | 1.25 |
Resist profile (sidewall angle and linewidth)
- SEM pictures to support graphs?
Result of image analysis of SEM images of 2µm triplets:
Result of image analysis of SEM images of 2µm triplets: