LabAdviser/314/Preparation 314-307/Solid-matter: Difference between revisions
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This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. | This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. | ||
[http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system | [http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system Broshure] | ||
[[File:IMG_3679.JPG|250px|left|thumb|Location Building 314, Common Area]] | [[File:IMG_3679.JPG|250px|left|thumb|Location Building 314, Common Area]] | ||
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= Missing equipment = | = Missing equipment = | ||