Specific Process Knowledge/Thermal Process/D4 III-V Oven: Difference between revisions
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===<span style="color:Red">EXPIRED!!! The D4 III-V Oven has been removed from the cleanroom August 2019. The C2 III-V Oxidation furnace is being tested instead.</span>=== | ===<span style="color:Red">EXPIRED!!! The D4 III-V Oven has been removed from the cleanroom August 2019. The C2 III-V Oxidation furnace is being tested instead.</span>=== | ||
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==III-V Oven (D4)== | ==III-V Oven (D4)== | ||
[[Image:IIIV_Oven.jpg|thumb|450x450px|III-V Oven (D4). Positioned in cleanroom area F-3.]] | [[Image:IIIV_Oven.jpg|thumb|450x450px|III-V Oven (D4). Positioned in cleanroom area F-3/ Photo: DTU Nanolab internal.]] | ||
The III-V Oven (D4) is used for wet thermal oxidation of III-V devices, for instance for lateral oxidation of thin AlGaAs layers to defined apertures in light-limiting diodes. | The III-V Oven (D4) is used for wet thermal oxidation of III-V devices, for instance for lateral oxidation of thin AlGaAs layers to defined apertures in light-limiting diodes. |
Revision as of 14:24, 31 January 2023
Feedback to this page: click here
This page is written by DTU Nanolab internal
EXPIRED!!! The D4 III-V Oven has been removed from the cleanroom August 2019. The C2 III-V Oxidation furnace is being tested instead.
III-V Oven (D4)
The III-V Oven (D4) is used for wet thermal oxidation of III-V devices, for instance for lateral oxidation of thin AlGaAs layers to defined apertures in light-limiting diodes.
The furnace is an old Tempress horizontal furnace. The quartz boat is loaded manually into the furnace by use of a push rod. The furnace is cooled down to room temperature when it is not being used.
Before use, devices have to be cleaned. A short BHF dip can be used to remove any native oxide which can be difficult to penetrate by a wet thermal oxidation.
Please check the cross contamination information in LabManager before you use the furnace.
The user manual and contact information can be found in LabManager:
Process knowledge
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Performance | Lateral oxidation rate |
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Process parameter range | Process temperature |
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Gasses on the system |
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Substrates | Batch size |
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Substrate materials allowed |
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