Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
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!Recommended experiment/Workspace | !Recommended experiment/Workspace | ||
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Check the user manual in LabManager | |||
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Check the user manaual in LabManager | |||
| | |Check the user manaual in LabManager | ||
|'''TappingMode 300nm trench''' (for steps <~1µm) | |'''TappingMode 300nm trench''' (for steps <~1µm) | ||
'''Tappping mode in air - 6µm Deep Trench''' (for steps >1~µm) | '''Tappping mode in air - 6µm Deep Trench''' (for steps >1~µm) | ||