Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
| Line 22: | Line 22: | ||
|For Topographic measurements with no steep/abrupt steps we also recommend '''ScanAsyst mode''' due to less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. We also recommend '''Tapping mode''' because we experience less problems when the tip end is slightly broken. | |For Topographic measurements with no steep/abrupt steps we also recommend '''ScanAsyst mode''' due to less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. We also recommend '''Tapping mode''' because we experience less problems when the tip end is slightly broken. | ||
|For Steep/abrupt steps but no high aspect ratio structures we still recommend '''Tapping mode''' or '''ScanAsyst mode" . | |For Steep/abrupt steps but no high aspect ratio structures we still recommend '''Tapping mode''' or '''ScanAsyst mode" . | ||
|For High aspect ratio measurements we recommend Tapping mode. | |For High aspect ratio measurements we recommend Tapping mode. We do not have experience with ScanAsyst therefore we recommend '''Tapping mode'''. | ||
|For large scan areas where you prioritize to scan fast then you can use '''contact mode'''. Here you can scan with scan rate of up to 2.43 Hz | |For large scan areas where you prioritize to scan fast then you can use '''contact mode'''. Here you can scan with scan rate of up to 2.43 Hz | ||
|- | |- | ||