Specific Process Knowledge/Lithography/UVExposure: Difference between revisions
Appearance
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==Aligner: Maskless 03== | ==Aligner: Maskless 03== | ||
MLA150 WMII maskless aligner from Heidelberg Instruments GmbH. | MLA150 WMII maskless aligner from Heidelberg Instruments GmbH. | ||
The logon password for the PC is "mla" (without quotation marks). | The logon password for the PC is "mla" (without quotation marks). | ||
Special features: | |||
'''Special features:''' | |||
*Backside Alignment | *Backside Alignment | ||
*Advanced Field Alignment Mode for alignment to individual chips/devices on the substrate | *Advanced Field Alignment Mode for alignment to individual chips/devices on the substrate | ||
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Equipment info in [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=464 LabManager] | Equipment info in [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=464 LabManager] | ||
===Exposure dose and defocus=== | |||
[[Specific Process Knowledge/Lithography/Resist#Aligner:_Maskless_02|Information on UV exposure dose]] | |||
===[[Specific Process Knowledge/Lithography/Aligners/Aligner: Maskless 03 processing|Process information]]=== | ===[[Specific Process Knowledge/Lithography/Aligners/Aligner: Maskless 03 processing|Process information]]=== | ||
*[[Specific_Process_Knowledge/Lithography/Aligners/Aligner:_Maskless_03_processing#Exposure_technology|Exposure technology]] | |||
[[Specific_Process_Knowledge/Lithography/Aligners/Aligner:_Maskless_03_processing#Exposure_technology|Exposure technology]] | *[[Specific_Process_Knowledge/Lithography/Aligners/Aligner:_Maskless_03_processing#Process_Parameters|Process Parameters]] | ||
*[[Specific_Process_Knowledge/Lithography/Aligners/Aligner:_Maskless_03_processing#Features|Features]] | |||
[[Specific_Process_Knowledge/Lithography/Aligners/Aligner:_Maskless_03_processing#Process_Parameters|Process Parameters]] | *[[Specific_Process_Knowledge/Lithography/Aligners/Aligner:_Maskless_03_processing#Alignment|Alignment]] | ||
[[Specific_Process_Knowledge/Lithography/Aligners/Aligner:_Maskless_03_processing#Features|Features]] | |||
[[Specific_Process_Knowledge/Lithography/Aligners/Aligner:_Maskless_03_processing#Alignment|Alignment]] | |||
=== Equipment performance and process related parameters === | === Equipment performance and process related parameters === | ||