Specific Process Knowledge/Lithography/Pretreatment: Difference between revisions
| Line 272: | Line 272: | ||
|} | |} | ||
<br> | <br> | ||
'''Contact angle:''' | '''Contact angle:'''<br> | ||
The contact angle of the substrate surface can be measured using the [[Specific_Process_Knowledge/Characterization/Drop_Shape_Analyzer|Drop Shape Analyzer]]. | The contact angle of the substrate surface can be measured using the [[Specific_Process_Knowledge/Characterization/Drop_Shape_Analyzer|Drop Shape Analyzer]]. | ||