Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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Phase: Phase imaging maps the phase lag between the periodic signal driving the cantilever and the oscillations of the cantilever. Changes in phase lag often indicate changes in the properties of the sample surface. Here the structuring in the graphene is very clear | Phase: Phase imaging maps the phase lag between the periodic signal driving the cantilever and the oscillations of the cantilever. Changes in phase lag often indicate changes in the properties of the sample surface. Here the structuring in the graphene is very clear | ||
==AFM Icon-Pt 2: Acceptance test | ==AFM Icon-Pt 2: Acceptance test== | ||
===Noise tests=== | ===Noise tests=== | ||
====Sensor noise==== | ====Sensor noise==== | ||