Specific Process Knowledge/Characterization/Profiler: Difference between revisions
Appearance
m →Equipment performance and process related parameters: correction |
|||
| Line 402: | Line 402: | ||
|style="background:LightGrey; color:black"|Resolution x y | |style="background:LightGrey; color:black"|Resolution x y | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
Theoretically down to 0.003 µm (in practice the resolution is limited by the tip size) | |||
|- | |- | ||
|style="background:LightGrey; color:black"|Resolution z | |style="background:LightGrey; color:black"|Resolution z | ||
| Line 410: | Line 410: | ||
|style="background:LightGrey; color:black"|Maximum sample thickness | |style="background:LightGrey; color:black"|Maximum sample thickness | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
100 mm | |||
|- | |- | ||
|- | |- | ||