Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
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===Peak Force KPFM (Kelvin Probe Force Microscopy)=== | ===Peak Force KPFM (Kelvin Probe Force Microscopy)=== | ||
Please flowing this link to Brukers homepage: | *Please flowing this link to Brukers homepage: | ||
[https://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/ApplicationNotes/AN140-RevA1-PeakForce_KPFM-AppNote.pdf pf-kpfm.html] - NOT WORKING ANYMORE | [https://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/ApplicationNotes/AN140-RevA1-PeakForce_KPFM-AppNote.pdf pf-kpfm.html] - NOT WORKING ANYMORE | ||
Application note on KPFM: [[:File:PeakForce-Kelvin-Probe-Force-Microscopy-App-Note-BRUKER.pdf]] | *Application note on KPFM: [[:File:PeakForce-Kelvin-Probe-Force-Microscopy-App-Note-BRUKER.pdf]] | ||
=Evaluation of used probes= | =Evaluation of used probes= | ||