Specific Process Knowledge/Thin film deposition/Wordentec: Difference between revisions
→Quality control (QC) for Wordentec: removed as it should not be here but under the metals |
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===Thickness measurement=== | ===Thickness measurement=== | ||
Read about how the machine measures the thickness of the growing film using a quartz crystal monitor [[Specific_Process_Knowledge/Thin_film_deposition/Temescal# | Read about how the machine measures the thickness of the growing film using a quartz crystal monitor [[Specific_Process_Knowledge/Thin_film_deposition/Temescal/Good to know about the Temescal#Deposition rate and thickness measurement accuracy|'''here''']]. | ||
===Particulates in the films=== | ===Particulates in the films=== | ||