LabAdviser/314/Microscopy 314-307/FIB/Hydra: Difference between revisions
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The plasma focused ion beam (PFIB) with inductively coupled plasma source supporting four ion species (Xe, Ar, O, N) provides the possibility of characterization of microstructures by imaging and serial sectioning via sputtering. The microscope is equipped with a nano manipulator for high quality TEM sample preparation and can with the AutoTEM software do automated lift-out procedures with high precision. | The plasma focused ion beam (PFIB) with inductively coupled plasma source supporting four ion species (Xe, Ar, O, N) provides the possibility of characterization of microstructures by imaging and serial sectioning via sputtering. The microscope is equipped with a nano manipulator for high quality TEM sample preparation and can with the AutoTEM software do automated lift-out procedures with high precision. | ||
The combination of PFIB sputtering capabilities, and 2-dimentional imaging facilitates 3-dimentional characterization. | The combination of PFIB sputtering capabilities, and 2-dimentional imaging facilitates 3-dimentional characterization. | ||
With the Maps software, it is possible to make automated mapping of large areas for a higher resolution of the image. | |||
=Reading Materials= | =Reading Materials= | ||