Specific Process Knowledge/Characterization/XPS/ISS: Difference between revisions
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This page is intended to have a lot of material on the applications of ISS. So far, however, we have only very limited experience in using this. Therefore, until we have something to present here you are referred to the [[Specific Process Knowledge/Characterization/XPS/NexsaOverview|comparison page]]. There, you will find a table with articles and application notes on all the options available on the XPS Nexsa. Please note that Ion Scattering Spectroscopy is also referred to as [https://en.wikipedia.org/wiki/Low-energy_ion_scattering LEIS]. | This page is intended to have a lot of material on the applications of ISS. So far, however, we have only very limited experience in using this. Therefore, until we have something to present here you are referred to the [[Specific Process Knowledge/Characterization/XPS/NexsaOverview|comparison page]]. There, you will find a table with articles and application notes on all the options available on the XPS Nexsa. Please note that Ion Scattering Spectroscopy is also referred to as [https://en.wikipedia.org/wiki/Low-energy_ion_scattering LEIS]. | ||
* [[Specific Process Knowledge/Characterization/XPS/ISS/Notes| Notes on ISS | |||
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Revision as of 14:27, 1 March 2021
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Ion Scattering Spectroscopy on XPS Nexsa
This page is intended to have a lot of material on the applications of ISS. So far, however, we have only very limited experience in using this. Therefore, until we have something to present here you are referred to the comparison page. There, you will find a table with articles and application notes on all the options available on the XPS Nexsa. Please note that Ion Scattering Spectroscopy is also referred to as LEIS.