Revision as of 08:07, 28 May 2020

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Electron Microscopy at DTU Nanolab building 314/307

At DTU Nanolab - building 314/307 are different types of microscopes available:


Transmission Electron Microscopy (TEM)	Scanning Electron Microscopy (SEM)	Dual-beam Electron Microcopes - Focused Ion Beam and Scanning Electron Microscope (FIB-SEM)

Depending on the equipment, different techniques are available:

THIS PAGE IS UNDER CONSTRUCTION


X-Ray spectroscopy (EDS/WDS)	Electron Energy Loss Spectroscopy (EELS)	Energy Filtered TEM (EFTEM)
Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)	Electron Holography


Available software at DTU Nanolab	Lattice fringe analysis	Remote Access for Staff

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 {| border="0" cellspacing="100" style="margin: auto;"
 |+
-| align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/TEM|TEM ]]
+| align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy 314-307/TEM|TEM ]]
-| align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/SEM|SEM ]]
+| align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy 314-307/SEM|SEM ]]
-| align="center" width="200px" | '''Dual-beam Electron Microcopes - Focused Ion Beam and Scanning Electron Microscope (FIB-SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/FIB|FIB ]]
+| align="center" width="200px" | '''Dual-beam Electron Microcopes - Focused Ion Beam and Scanning Electron Microscope (FIB-SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=FIB|FIB ]]
 |}