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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
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===Demonstrating roughness measurements on silicon===
===Demonstrating roughness measurements on silicon===
#ScanAsyst with ScanAsyst-air
#ScanAsyst with ScanAsyst-air
**CL on
*CL on
**512x512
*512x512
**0dg
*0dg
**ScanAsyst noise threshold: 1
*ScanAsyst noise threshold: 1
**PeakForce amplitide 300 nm
*PeakForce amplitide 300 nm
**Peak force frequency: 2 Hz
*Peak force frequency: 2 Hz
**Rq: 0.247 nm
*Rq: 0.247 nm
##ScanAsyst with ScanAsyst-air
#ScanAsyst with ScanAsyst-air
**CL off
**CL off
**512x512
**512x512
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